@MrChips Nice research.
It's certainly pointing towards that direction.
on edit ...
If there were an oscillation, lets say a 10 nS, 1 volt pulse @ 100khz rate, that would increase the 0.5v reading on the emitters of the Q503/Q505by a millivolt, something beyond the recognition of the multimeter. That's why a single trace scope test would be beneficial. If it triggered on a 2V signal that means the amplitude of the signal exceeded 1.5V (2V minus the base voltage of 0.5V). That's all we would know. Increasing the trigger level to where the scope no longer illustrates the trace would give an idea of the characteristics of the pulse.
The test can run as long as you want. Any noise impulses exceeding the trigger level will trigger the scope.
Right now, I'm still leaning towards the counterfeit transistors, from suspect to probable. The scope test will push me confidently into certainly.
It's certainly pointing towards that direction.
on edit ...
If there were an oscillation, lets say a 10 nS, 1 volt pulse @ 100khz rate, that would increase the 0.5v reading on the emitters of the Q503/Q505by a millivolt, something beyond the recognition of the multimeter. That's why a single trace scope test would be beneficial. If it triggered on a 2V signal that means the amplitude of the signal exceeded 1.5V (2V minus the base voltage of 0.5V). That's all we would know. Increasing the trigger level to where the scope no longer illustrates the trace would give an idea of the characteristics of the pulse.
The test can run as long as you want. Any noise impulses exceeding the trigger level will trigger the scope.
Right now, I'm still leaning towards the counterfeit transistors, from suspect to probable. The scope test will push me confidently into certainly.
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