Is it possible to test diodes and transistors directly in-circuit, using the Atlas DCA55?

Thread Starter

bob2

Joined Jun 15, 2019
213
The question is, what are the negative points to use this device for in-circuit measurements?
Perhaps someone has already tried doing this kind of thing.
 

dl324

Joined Mar 30, 2015
12,871
The question is, what are the negative points to use this device for in-circuit measurements?
It depends on the circuit. You can usually do open/short junction tests, but you can't do any quantitative measurements (e.g. measure beta) because other components will likely interact with the device you're trying to test.

EDIT:
This is from the manual:
clipimage.jpg
 

MrChips

Joined Oct 2, 2009
23,541
This holds true for any and every type of test equipment. It does not matter if it is analog, digital, or otherwise.
 

Papabravo

Joined Feb 24, 2006
16,165
Circuits can be "designed for test" so that certain measurements can be made in circuit. There is a cost for this design choice and many manufacturers are not willing to pay that cost.
 
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