Concept of Charge trapping-Flash Memory (Nor Flash)


Joined Mar 30, 2015
FLASH memory uses a floating gate to store charge, just like EPROM and EEPROM.

FLASH and EEPROM use FNT to transfer charge. EPROM uses hot electron injection.

Charge trapping is an undesirable defect that causes bit failure. NOR FLASH is EOL after the first bit failure.
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