Hi, look at the 2N7000 datasheet.
https://www.mouser.com/datasheet/2/149/2N7002-8405.pdf


Can you explain to me why ID_max_pulsed is lower than the typical value of ID_ON?


And ID_ON





Ans I know about the note 1. "Pulse Test: Pulse Width < 300μs, Duty Cycle < 2.0%"

 

What this means is that if you have a Vgs pf 4.5 volt, and manage to operate the Fet linearly such that you can maintain a Vds of 10 volt, you could get a drain current of 600 mA.

Of course, at those conditions the poor FET would be dissipating 6 watts, which would almost immediately burn your device.

That parameter is there to show you the device's transconductance. It is not an operating parameter.

 

Can you explain to me why ID_max_pulsed is lower than the typical value of ID_ON?

The former spec is an absolute maximum rating beyond which you risk damaging or destroying the device; while the latter is a performance characteristic indicating the typical behavior of the device.

 

The former spec is an absolute maximum rating beyond which you risk damaging or destroying the device; while the latter is a performance characteristic indicating the typical behavior of the device.

But what is the point of a typical behavior characteristic if I cannot use it in real life?

 

But what is the point of a typical behavior characteristic if I cannot use it in real life?

Good question. Wish I knew the answer.

 

You can use typical values if you know how and where to apply them.

For the “how”: apply the derating factors like temperature and SOA, to the typical values.

For the “where”: if this is a single personal project, you can use the typical values.
If in the other hand this is a mission critical device, whose failure could lead to loss of property or life, then you should use the worst case values and add some additional margins.