while testing, we see abnormal function at each output.
looks there is an issue in the marked two diodes. let me know if we can by pass these diodes to test the device or how to check if the issue is internally or external circuit.

regards,
Murali

 

Those diodes are parasitic diodes created by the CMOS process the part is
built in. Under normal operation they are reverse biased so effectively out of the
circuit.

See Notes 1 : on page 4 of datasheet.

https://www.renesas.com/us/en/www/doc/datasheet/dg411-12-13.pdf


Regards, Dana.

 

Those diodes are parasitic diodes created by the CMOS process the part is
built in. Under normal operation they are reverse biased so effectively out of the
circuit.

See Notes 1 : on page 4 of datasheet.

https://www.renesas.com/us/en/www/doc/datasheet/dg411-12-13.pdf


Regards, Dana.

thanks,
we face the failure or drop in voltage while doing inner structure testing.
so, can we conclude the part we bought is faulty part and need to escalate to intersil?

regards,

 

we face the failure or drop in voltage while doing inner structure testing.

What is "inner structure testing"?

 

Well you can test for the presence of the diodes on each pin. Not unusual if
a part is zapped those diodes on zapped pin take a hit. You will not see a
Vbe when forward biasing them. With all inputs grounded measure Idd, supply
current. If its out of wack part is probably bad.


Regards, Dana.

 

while testing, we see abnormal function at each output.
looks there is an issue in the marked two diodes. let me know if we can by pass these diodes to test the device or how to check if the issue is internally or external circuit.

thanks,
we face the failure or drop in voltage while doing inner structure testing.
so, can we conclude the part we bought is faulty part and need to escalate to intersil?

What is this abnormal function? What voltage is dropping where?

English may not be good yours, so please make a sketch of your test circuit and show what voltage is being applied, what load is placed where, and what voltages you measure.

 

No information is provided as to what the test is, what it is supposed to be testing or what the results are supposed to be, and no information is given as to what the circuit output is supposed to be. Without that information the very best you can get is a bunch of random guesses.
AND, if you do not know what the test is and what the results are supposed to be, there is no point in doing any of the testing, and I wonder why you would even be attempting to test if you have no information.

 

Example:

 

Once again, there is no adequate information as to what portion of the test is failing to meet which specification. In addition there is not any description of how the test is being done, or what voltages are being used. Certainly the data sheet is lacking in an adequate explanation of what tests are done to produce the results provided, that is unfortunate.
The normal function of such an analog switch device is to provide an open circuit simulation when it is off, and to provide some rather constant series resistance between the selected input and the output connection when the selection is on. Normal operation requires that both the positive supply voltage and the negative supply voltage be applied to the power supply terminals, each referenced to the common terminal. In addition, since it is a CMOS device, all of the control inputs must be supplied with the correct logic levels and not left open.
The voltage at the switched signal input must be within the limits described in the data sheet, operation outside those limits is not predictable nor claimed to be usable.
So if there is an apparent problem with the protective diodes it may be that the test conditions are not as the data sheet requires.
It is very unfortunate that the simple diagram depicts it the same as a mechanical relay switch.