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Could a modern simulator show these glitches?It is SUPPOSED to reset both counters as soon as the right-hand counter's Q1 and Q2 outputs both go HI.
In practice, this is a very poor design and will be very susceptible to glitches.
The 74H160 is a synchronous counter, which means that all of the Q outputs change, nominally, at the same time. But in reality there will always be slight differences due to a host of factors. As a result, all possible transition paths need to be considered. For instance, when going from 3 to 4, the outputs are going from
0011 to 0100
But the possible paths to get there are
0011 -> 0010 -> 0000 -> 0100
0011 -> 0010 -> 0110 -> 0100 NAND glitches LO
0011 -> 0001 -> 0000 -> 0100
0011 -> 0001 -> 0101 -> 0100
0011 -> 0111 -> 0110 -> 0100 NAND glitches LO
0011 -> 0111 -> 0101 -> 0100 NAND glitches LO
Assuming equal probabilities for each path (which may or may not be a reasonable assumption), you can expect the NAND gate output to glitch LO about half the time.
The glitch only has to last long enough for the asynchronous reset to recognize and act on it, which might be only a few nanoseconds. This is much shorter than the maximum propagation delays from a clock input to a change in one of the Q outputs, which are in the dozens or even hundreds of nanoseconds. Thus, seeing differences in the propagation delays that are long enough for the reset to act is highly likely. It's also possible that width of the glitch pulse will be marginal and that only one or the other counter will act on it (and which one does is completely unpredictable).
More than likely, this is yet another example of a textbook circuit designed by someone that has never designed a circuit that had to work in the real world.
Depends on the device model more than the simulator (unless it's a pure-digital simulator, in which case the compatible models probably couldn't support the needed level of fidelity).Could a modern simulator show these glitches?