Single events due to ionizing particle

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engr_david_ee

Joined Mar 10, 2023
358
I was reading about single-events and found this statement.

"Single-Event Upsets (SEU): A single-event upset (SEU), also known as a single-event error (SEE), is a change of state caused by one single ionizing particle (ions, electrons, photons...) striking a sensitive node in a live micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistors. The SEU itself is not considered permanently damaging to the transistor's or circuits' functionality unlike the case of single-event latch-up (SEL), single-event gate rupture (SEGR), or single-event burnout (SEB)."

Does this means that SEU is not a permanent damage to the component but SEL, SEGR and SEB can cause permanent damage to the component ?
 

MrChips

Joined Oct 2, 2009
34,628
I was reading about single-events and found this statement.

"Single-Event Upsets (SEU): A single-event upset (SEU), also known as a single-event error (SEE), is a change of state caused by one single ionizing particle (ions, electrons, photons...) striking a sensitive node in a live micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistors. The SEU itself is not considered permanently damaging to the transistor's or circuits' functionality unlike the case of single-event latch-up (SEL), single-event gate rupture (SEGR), or single-event burnout (SEB)."

Does this means that SEU is not a permanent damage to the component but SEL, SEGR and SEB can cause permanent damage to the component ?
Yes.
 

MisterBill2

Joined Jan 23, 2018
27,164
The good news is that earths atmosphere prevents those ionized particles from reaching us here on the ground. And even in commercial airliners we are rather safe from them.
 
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