Hi,
I made a schematic for testing resistance on LCC package pins.
I need to test resistance between 1 fixed pin from the LCC package (Pin #8) against 7 different pins with automatic switching and measuring.
For that i chose ISL84781IVZ-T 8:1 multiplexer ic controlled by MCU,
The fixed pin (Pin #8) is connected to one side of the DMM through U5 testpoint ,
while the COM pin from the multiplexer is connected to the other DMM input through U3 testpoint.
The issue is that when i connect all the wires from the multiplexer to the LCC package (SRC1_1, SRC1_2, etc..) , i get wrong resistance measurements (much lower values then expected).
Only when i disconnect all wires and leave only one connection (SRC1_1 for example), i receive correct measurements as expected on the single line.
Can you find any issues with the multiplexer concept ? is this behaviour expected? (any kind of crosstalk inside the multiplexer?)
Please advise,
Thank you
Nir.
I made a schematic for testing resistance on LCC package pins.
I need to test resistance between 1 fixed pin from the LCC package (Pin #8) against 7 different pins with automatic switching and measuring.
For that i chose ISL84781IVZ-T 8:1 multiplexer ic controlled by MCU,
The fixed pin (Pin #8) is connected to one side of the DMM through U5 testpoint ,
while the COM pin from the multiplexer is connected to the other DMM input through U3 testpoint.
The issue is that when i connect all the wires from the multiplexer to the LCC package (SRC1_1, SRC1_2, etc..) , i get wrong resistance measurements (much lower values then expected).
Only when i disconnect all wires and leave only one connection (SRC1_1 for example), i receive correct measurements as expected on the single line.
Can you find any issues with the multiplexer concept ? is this behaviour expected? (any kind of crosstalk inside the multiplexer?)
Please advise,
Thank you
Nir.
