Hi, I have multiple questions about crystal measurements.
My MCU is STM8AF & I have a crystal with these specifications: 8MHz, ESR=50ohm, C0=5pF, CL=15pF and Typical Drive Level is 50 micro W and Max Drive Level is 300 micro W. I see conflicts in measuring drive level in different documents (I attached related parts)... When I use a current probe my drive level is a lot more than 50 and when I use 1pF active probe there will be much less drive level! I don't know which one to rely on!
Additionally, I attached Safety factor and gain margin sections ... does RExt affect gain margin? according to the formula it does! but according to safety factor measurement and formula RExt doesn't influence SF! so should we remove it during SF measurement or not? aren't SF and GM correlated? if so, why don't they share same point of view about Rext ?
Thanks in advance,
(the documents are AN2867 from ST and Crystal_Oscillators from Digital Electronics autumn 2014)
My MCU is STM8AF & I have a crystal with these specifications: 8MHz, ESR=50ohm, C0=5pF, CL=15pF and Typical Drive Level is 50 micro W and Max Drive Level is 300 micro W. I see conflicts in measuring drive level in different documents (I attached related parts)... When I use a current probe my drive level is a lot more than 50 and when I use 1pF active probe there will be much less drive level! I don't know which one to rely on!
Additionally, I attached Safety factor and gain margin sections ... does RExt affect gain margin? according to the formula it does! but according to safety factor measurement and formula RExt doesn't influence SF! so should we remove it during SF measurement or not? aren't SF and GM correlated? if so, why don't they share same point of view about Rext ?
Thanks in advance,
(the documents are AN2867 from ST and Crystal_Oscillators from Digital Electronics autumn 2014)
Attachments
-
117.6 KB Views: 10
-
186 KB Views: 10
-
80.4 KB Views: 10
-
89.7 KB Views: 10


