**The following is a random experiment.**

**A wafer from a semiconductor manufacturing is to be selected randomly and a location on the wafer inspected for contamination particles. The sample space for the number of contamination particles at the inspected location is S= {0, 1, 2, 3, 4, 5}.**

**Relative frequencies for these outcomes are 0.4, 0.2, 0.15, 0.10, 0.05 and 0.10 respectively.**

**Use relative as probabilities.**

**Let A be the event that there are no contamination particles at the inspected location.**

**Let B be the event that there are at most three contamination particles at the inspected location.**

**Let C be the event that there are an odd number of contamination particles at the inspected location.**

**1- How many events are possible?**

**2- Find the probability of the following:**

**- complement of A**

**- B and C ( or B intersection C)**

For the first question:

Total events =2^6

For the second question I have no idea.

thank you

B