Hi, Please can I have some help with problem.
The following is a random experiment.
A wafer from a semiconductor manufacturing is to be selected randomly and a location on the wafer inspected for contamination particles. The sample space for the number of contamination particles at the inspected location is S= {0, 1, 2, 3, 4, 5}.
Relative frequencies for these outcomes are 0.4, 0.2, 0.15, 0.10, 0.05 and 0.10 respectively.
Use relative as probabilities.
Let A be the event that there are no contamination particles at the inspected location.
Let B be the event that there are at most three contamination particles at the inspected location.
Let C be the event that there are an odd number of contamination particles at the inspected location.
1- How many events are possible?
2- Find the probability of the following:
- complement of A
- B and C ( or B intersection C)
For the first question:
Total events =2^6
For the second question I have no idea.
thank you
B
The following is a random experiment.
A wafer from a semiconductor manufacturing is to be selected randomly and a location on the wafer inspected for contamination particles. The sample space for the number of contamination particles at the inspected location is S= {0, 1, 2, 3, 4, 5}.
Relative frequencies for these outcomes are 0.4, 0.2, 0.15, 0.10, 0.05 and 0.10 respectively.
Use relative as probabilities.
Let A be the event that there are no contamination particles at the inspected location.
Let B be the event that there are at most three contamination particles at the inspected location.
Let C be the event that there are an odd number of contamination particles at the inspected location.
1- How many events are possible?
2- Find the probability of the following:
- complement of A
- B and C ( or B intersection C)
For the first question:
Total events =2^6
For the second question I have no idea.
thank you
B