design for testability is process ensure that design has enough observability and controllability to provide for complete and efficient test

test circuit is integrated to original circuit for purpose of testing

Example - built in self test circuitry to original circuit
- scan circuitry to original circuit


built in self test - capability of circuit to test itself

built in self test circuitry incorporated within chip for self testing

test vector ---> original circuit & self test circuitry --> output response

scan design - scan is technique used in design for testing

test vector ---> original circuit & scan circuitry --> output response

Q- how does test vector generate for built in self and scan design

I think for scan we use ATPG to generate tset vector
does we use ATPG for built in self test

Q how does design make testable ?

I think we add some flip flop and mux to make testable design

Q can someone little bit how does circuit make controllable and observable

 

The ultimate testable machine fits into either of two categories: first, there is a socket available that the test control cable plugs into (or an IC can be pulled to make a socket available), or second, the machine is so easy to disassemble that replacing parts is fast and simple.

 

Homework?

 

Homework?

Could be.

Hello Vaed

Are You studying for a test engineer you?
The two topics, You started are related to what we might call -test systems- or test equipment.
Why did not continue over here:
http://forum.allaboutcircuits.com/showthread.php?p=742128#post742128

 

Could be.

Hello Vaed

Are You studying for a test engineer you?
The two topics, You started are related to what we might call -test systems- or test equipment.
Why did not continue over here:
http://forum.allaboutcircuits.com/showthread.php?p=742128#post742128

yes I am studying about VLSI testing

this post only I have asked about testable design how does vlsi circuit make testable

 

Homework?

design for testability is process ensure that design has enough observability and controllability to provide for complete and efficient test

test circuit is integrated to original circuit for purpose of testing

Example - built in self test circuitry to original circuit
- scan circuitry to original circuit


built in self test - capability of circuit to test itself

built in self test circuitry incorporated within chip for self testing

test vector ---> original circuit & self test circuitry --> output response

scan design - scan is technique used in design for testing

test vector ---> original circuit & scan circuitry --> output response

Q- how does test vector generate for built in self and scan design

I think for scan we use ATPG to generate tset vector
does we use ATPG for built in self test

Q how does design make testable ?

I think we add some flip flop and mux to make testable design

Q can someone little bit how does circuit make controllable and observable

look at this post I asked question and given some option I don't want that someone explain in detail

 

I suggest you read this course and find your answers there. http://www.csee.umbc.edu/~cpatel2/links/418/
No doubt there are many more freely accessible courses on the net, you just need to spend about 30s googling.

 

Q- how does test vector generate for built in self and scan design

There are many many ways to generate test vectors, including Automatic Test Program Generation (ATPG)

Q can someone little bit how does circuit make controllable and observable

Scan cells, Boundary Scan cells and other special circuits or normal resources.