For the base-emitter junction to be in breakdown, it must be reverse-biased and therefore the transistor will be turned off; therefore, I should think the collector current will be essentially zero, not counting leakage.I can find lots of info on collector-base junction breakdown and the resulting collector current, but in a common-emitter circuit how is collector current affected by breakdown of the base-emitter junction?
I don't think there will necessarily be any significant damage to the BE junction unless you force so much current through it that it's destroyed by heat. My understanding is that reverse-biasing the BE junction to the point where it breaks over and conducts a modest amount of current (like a Zener diode) can somewhat affect the β of the transistor and/or increase its noise level; other than that I doubt the transistor would be any the worse for wear.With the damage caused by breakdown of the base-emitter junction I was wondering if the collector-base junction could be affected in any way so that the collector-emitter leakage might suddenly become an avalanche?
In a common-emitter BJT configuration, for say an NPN transistor, the collector current is affected by the voltage drop across the BE junction (knee). So if you have 12V on the collector to power something, the collector is only going to see 11.x volts at whatever current the load requires unless the BJT is being operated in the linear region and is limiting the current flow to something less than the load requires.I can find lots of info on collector-base junction breakdown and the resulting collector current, but in a common-emitter circuit how is collector current affected by breakdown of the base-emitter junction?
Hi,Here on page 23
https://books.google.pl/books?id=6aXvOF4coukC&pg=PA22&dq=Analysis+and+Design+of+Analog+Integrated+Circuits+avalanche&hl=pl&sa=X&ved=0ahUKEwjSrrzf8Y3oAhWs8qYKHTH0CPwQ6AEIKzAA#v=onepage&q=Analysis and Design of Analog Integrated Circuits avalanche&f=false
We can read that base-emitter breakdown is damaging to the device. It can cause a large degradation in β_f.
by Jake Hertz
by Jake Hertz
by Jake Hertz
by Jeff Child