fault in vlsi

Discussion in 'Homework Help' started by vead, Jun 4, 2014.

  1. vead

    Thread Starter Active Member

    Nov 24, 2011
    621
    8
    how does designer detect and fix fault in vlsi circuit ?
    does large vlsi circuit contain additional test circuit ?
     
  2. WBahn

    Moderator

    Mar 31, 2012
    17,715
    4,788
    What kind of fault?
     
  3. Papabravo

    Expert

    Feb 24, 2006
    10,135
    1,786
    Prior to fabrication faults are detected via simulation. After fabrication, faults are detected by automated testing and the dice with faults are discarded. First silicon may have yields under 50%, but as the process is refined they can approach 99%

    All chips manufactured have test circuitry in them to facilitate automated testing. Here is a link on Boundary Scan testing

    http://en.wikipedia.org/wiki/Boundary_Scan
     
    vead and absf like this.
  4. vead

    Thread Starter Active Member

    Nov 24, 2011
    621
    8
    Fault may occur anytime
    - Design
    - Process
    - Package

    circuit design
    functional design
    structural design
    layout design

    when we design circuit on software , error can be determine by the simulation

    vlsi circuit contain additional test circuit like fault modeling
    stuck at faults
    Bridging faults
    Transistor stuck-open faults
    Delay faults

    error can be determine by fault simulation

    we can test circuit to determine fault
    Q1 what is test generation ?

    Q2 scan is technique used in design for testing ?

    Q3 built in self test

    built in self test method that allow circuit to test their own operation
     
    Last edited: Jun 5, 2014
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