Prior to fabrication faults are detected via simulation. After fabrication, faults are detected by automated testing and the dice with faults are discarded. First silicon may have yields under 50%, but as the process is refined they can approach 99%how does designer detect and fix fault in vlsi circuit ?
does large vlsi circuit contain additional test circuit ?
by Duane Benson
by Duane Benson
by Aaron Carman
by Jake Hertz