characterization of thin films

Discussion in 'General Electronics Chat' started by bhavyu, Mar 20, 2009.

  1. bhavyu

    Thread Starter New Member

    Mar 17, 2009
    1
    0
    Hi all,
    I am currently working on some Barium Strontium Titanate and Aluminum Oxide thin film samples having n-Silicon as the substrate. I have done a voltage sweep from +20V to -20V on the devices with the frequency constant for each sweep. The frequencies that I used are 1 kHz, 1 MHz and 10 MHz. Can anyone tell me how to find out the behavior of the devices in general from the values obtained from the voltage sweep.

    Thanks in Advance.
     
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